- Geller Reference Standard MRS-3The MRS-3 is a universal magnification calibration standard suitable for a wide range of instrumentation. Magnifications from 10X to 50,000X. 2µm minimum pitch. Traceable to national labs for ISO9000 and ISO17025.Call for leadtime
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Call for leadtime - Geller Reference Standard MRS-4A fifth Generation, high magnification reference standard for instrument calibration from 10X to 200,000X (1/2µm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.Call for leadtime
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Call for leadtime - Geller Reference Standard MRS-6A fifth generation Magnification Reference Standard & Stage Micrometer for instrument calibration from 1,500X to 1,000,000X (80nm minimum pitch). NIST and NPL traceable for ISO9000 and ISO17025.Call for leadtimeCall for leadtime
- Geller reference standard re-callibration serviceGeller MicroAnalytical magnification standards can be cleaned and re-certified to assure continued use as a traceable standard.Call for leadtime
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Call for leadtime - 145nm AFM Reference Standard for AFMThe 145nm pitch is accurate to ±1nm.Call for leadtime
From £956.72
Call for leadtime - 292nm pitch resolution reference standards for AFM292nm pitch reference standard for very high resolution calibration of AFM.Call for leadtime
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Call for leadtime - 2-D holographic array standards2-D holographic array standards for simultaneous calibration of X and Y axes.Call for leadtime
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Call for leadtime - Highly Ordered Pyrolytic Graphite (HOPG)HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopy.Average lead time: 1 day
From £121.96
Average lead time: 1 day - Gold calibration kitGold colloids of known size provide a reliable means of characterising tip geometry and calibrating the Z-axis to piezoelectric response.Call for leadtime
From £119.52
Call for leadtime - Calibration gratings - TGXYZ seriesCalibration gratings arrays of different structures comprising rectangular silicon dioxide steps on a silicon wafer.Call for leadtime
From £197.45
Call for leadtime - Grating type TGXThe TGX series silicon calibration grating is an array of square holes with sharp undercut edges formed by the (110) crystallographic planes of silicon. The typical radius of the edges is less than 5 nmCall for leadtime
From £197.45
Call for leadtime - Calibration grating sets TGSSets of calibration gratings and test structures are available to suit different requirements.Call for leadtime
From £233.78
Call for leadtime - Calibration gratingsThe calibration gratings feature one-dimensional arrays of trapezoidal steps etched into a silicon substrate.Call for leadtime
From £197.45
Call for leadtime - Sample for characterisation of tip shapeSample for characterisation of tip shape with hard sharp pyramidal nanostructures. The structures are covered by a highly wear-resistant layer.Call for leadtime
From £197.45
Call for leadtime - HOPGHighly ordered pyrolytic graphite (HOPG) is a lamellar material and consists of stacked planes.Call for leadtime
From £59.23
Call for leadtime - Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.Call for leadtime
From £52.20
Call for leadtime - Critical dimension (CD) calibration test specimens - 500-200-100 nm...This advanced CD calibration test specimen is suitable for calibrating smaller structures.Call for leadtime
From £725.22
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