Sample for characterisation of tip shape
Sample for characterisation of tip shape with hard sharp pyramidal nanostructures. The structures are covered by a highly wear-resistant layer.
Same day dispatch for all in-stock UK orders placed before 1pm
ORDER ONLINE - no minimum order value
AGENTS & DISTRIBUTORS - available worldwide
REQUEST QUOTES - fast online pricing
- Home
- AFM & SPM
- Calibration Standards
- Sample for characterisation of tip shape
All prices exclude VAT.
Product DescriptionDelivery & Returns
Sample for characterisation of tip shape with hard sharp pyramidal nanostructures. The structures are covered by a highly wear-resistant layer.
- Pyramid base - 50-100nm
- Pyramid height - 50-150nm
- Smallest edge radii <5nm
- Active area - 5x5mm
- Chip dimensions - 5x5x0.3mm
LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
Delivery is calculated at the checkout, please see our delivery and returns page for more information.
More AFM & SPM
LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.