FIB Sectioning Service

Agar Scientific and NanoScope Services are partnering to offer two unique FIB services in specimen preparation. Focussed Ion Beam or FIB offers many possibilities for preparing sections not possible using more conventional mechanical polishing or sectioning methods.

• FIB prepared ‘Ultra thin’ TEM sections . This tried and tested process has been used routinely for many years and successfully applied by NanoScope to prepare customers samples from over 200 material types.
• FIB prepared Micro-Cross Sections. FIB can precisely locate and section a feature on a sample and directly take images of it. Multiple slices can be taken through the same feature.