Supplies and consumables for AFM & SPM

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AFM & SPM

Calibration Standards

Calibration Standards

Diamond Knives

Diamond Knives

Probes - HQ Series

Probes - HQ Series

Probes - OPUS Series

Probes - OPUS Series

Probes - General Imaging (SCOUT Range)

Probes - General Imaging (SCOUT Range)

Probes - Conductive (SPARK Range)

Probes - Conductive (SPARK Range)

Specimen Preparation

Specimen Preparation

Specimen Storage

Specimen Storage

Substrates

Substrates

LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.