JavaScript seems to be disabled in your browser. For the best experience on our site, be sure to turn on Javascript in your browser.

Language

£GBP

ORDER ONLINE - no minimum order value

AGENTS & DISTRIBUTORS - available worldwide

REQUEST QUOTES - fast online pricing

Home
AFM & SPM
Calibration Standards
Critical dimension (CD) calibration test specimens - 500-200-100 nm structure

Critical dimension (CD) calibration test specimens - 500-200-100 nm structure

This advanced CD calibration test specimen is suitable for calibrating smaller structures.

All prices exclude VAT.

Description

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGS1998 CD Calibration Specimen 500-200-100nm non certified Loading...	Loading...	£725.22	£725.22

Product Description

This advanced CD calibration test specimen is suitable for calibrating smaller structures. It comprises three line patterns, each identified by its pitch. Each pattern has five bars and spaces of equal pitch: 500, 200 and 100 nm. The central line area can be used for AFM measurements. The patterns are etched into silicon with a depth of approximately 45 to 50 nm. There is no coating on the silicon surface.

The specimen can be supplied unmounted or mounted on any of the standard range of SEM stubs. Please specify.

Delivery & Returns

More AFM & SPM

Calibration Standards Diamond Knives Probes - HQ Series Probes - OPUS Series Probes - General Imaging (SCOUT Range)Probes - Conductive (SPARK Range)Specimen Preparation Specimen Storage Substrates

LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.