A range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.
This range of gold on silicon and tin on silicon specimens has been specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem. The specimens have the same specifications as the larger standard calibration specimens but are prepared on a very thin silicon substrate. Specimens are supplied unmounted.
500µm thick: regularly shaped, nominally 5 x 5mm
230-330µm thick: irregularly shaped, variably sized
