- Sample pins for Cryo-UltramicrotomesCryo sample pins with 2mm diameter pins compatible with Leica & RMC Cryo-Ultramicrotomes.Average lead time: 1 day
From £8.85
Average lead time: 1 day - Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.Call for leadtime
From £52.20
Call for leadtime - SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 day
From £69.08
Average lead time: 1 day - Scintillator discs - Plano P47All discs are 1mm thick, unless otherwise specified.Call for leadtime
From £51.07
Call for leadtime - Apertures, 4.0 x 0.6mm, Platinum/Iridium4mm dia, 0.6mm thick. Platinum/Iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.Average lead time: 1 day
From £49.76
Average lead time: 1 day - Crystalbond AdhesivesCrystalbond adhesives allow temporary bonding of delicate crystals, metallurgical samples, glass components and ceramic substrates.Average lead time: 1 day
From £33.03
Average lead time: 1 day - Apertures, 1.85 x 0.1mm, Platinum/Iridium1.85mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.Average lead time: 1 day
From £55.37
Average lead time: 1 day - Tin on Carbon AGS1988 - Low Voltage Resolution Test SpecimenLow voltage resolution test specimen with a particle size range from approximatelyAverage lead time: 1 day
From £69.45
Average lead time: 1 day - Pin type adaptor for Cambridge analytical stub AGG3657Adaptor allowing 32mm Cambridge stubs with re-entrant bases to be used in a stage designed for pin type stubs.Call for leadtimeSpecial Price £67.13 was £128.48 You save: £73.62 (48%)Call for leadtime
- Carbon DiscsA range of 3mm thick carbon discs for mounting specimens.Average lead time: 1 day
From £22.03
Average lead time: 1 day - SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.In StockSpecial Price £34.97 was £64.44 You save: £35.36 (46%)In Stock
- Apertures, 10.0 x 0.6mm, Platinum/Iridium10mm dia, 0.6mm thick. Platinum/iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.Average lead time: 1 day
From £99.76
Average lead time: 1 day - Wehnelt AperturesReplaceable apertures for the Wehnelt cylinder can be supplied to fit some microscopes.Average lead time: 1 day
From £81.82
Average lead time: 1 day - Apertures, 2.0 x 0.1mm, Platinum/Iridium2mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.Average lead time: 1 day
From £52.74
Average lead time: 1 day - Gold on Carbon AGS1969 - High Resolution Test SpecimenHigh resolution test specimen with a particle size range from approximately 3 - 50nm.Average lead time: 1 day
From £96.34
Average lead time: 1 day - Calibration Specimens on Ultra Thin SubstratesA range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.Average lead time: 1 day
From £84.36
Average lead time: 1 day - Phenofree Hot Mounting ResinsPhenol-free and formaldehyde-free thermosetting mounting resins.Call for leadtime
From £33.19
Call for leadtime - Mikrostik Non-Conductive Adhesive, 14ml AGG3793Fast drying, ultrathin clear adhesive suitable for mounting small particles which can be submerged in other adhesives.In StockSpecial Price £10.21 was £10.52 You save: £0.37 (3%)In Stock
- TEM grid holder on SEM pin stubA pin-type aluminium stub allowing four TEM grids to be securely held for SEM work.Average lead time: 1 day
From £61.35
Average lead time: 1 day - SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. CarbonIn StockSpecial Price £2.83 was £28.55 You save: £30.86 (90%)In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.In StockSpecial Price £4.93 was £5.86 You save: £1.12 (16%)In Stock
- Average lead time: 1 day
- Disc Targets - PalladiumA range of spare targets is available for most well known makes of sputter coaters.Average lead time: 1 day
From £275.00
Average lead time: 1 day - Numbered StubsSequentially numbered stubs (1 - 10) for easy identification of samples.Average lead time: 1 day
From £12.52
Average lead time: 1 day


























