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23 products available

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  1. Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...
    This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.
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    From £52.20

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  2. SEM Specimen Stubs, 32mm dia, 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
    Average lead time: 1 day

    From £69.08

    Average lead time: 1 day
  3. Apertures, 4.0 x 0.6mm, Platinum/Iridium
    4mm dia, 0.6mm thick. Platinum/Iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £49.76

    Average lead time: 1 day
  4. Apertures, 1.85 x 0.1mm, Platinum/Iridium
    1.85mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £55.37

    Average lead time: 1 day
  5. Tin on Carbon AGS1988 - Low Voltage Resolution Test Specimen
    Low voltage resolution test specimen with a particle size range from approximately
    Average lead time: 1 day

    From £69.45

    Average lead time: 1 day
  6. Pin type adaptor for Cambridge analytical stub AGG3657
    Adaptor allowing 32mm Cambridge stubs with re-entrant bases to be used in a stage designed for pin type stubs.
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    Special Price £67.13 was £128.48 You save: £73.62 (48%)
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  7. Carbon Discs
    A range of 3mm thick carbon discs for mounting specimens.
    Average lead time: 1 day

    From £22.03

    Average lead time: 1 day
  8. SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595
    SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.
    In Stock
    Special Price £34.97 was £64.44 You save: £35.36 (46%)
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  9. Apertures, 10.0 x 0.6mm, Platinum/Iridium
    10mm dia, 0.6mm thick. Platinum/iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £99.76

    Average lead time: 1 day
  10. Apertures, 2.0 x 0.1mm, Platinum/Iridium
    2mm dia, 0.1mm thick. Platinum/iridium. High quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £52.74

    Average lead time: 1 day
  11. Gold on Carbon AGS1969 - High Resolution Test Specimen
    High resolution test specimen with a particle size range from approximately 3 - 50nm.
    Average lead time: 1 day

    From £96.34

    Average lead time: 1 day
  12. Calibration Specimens on Ultra Thin Substrates
    A range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.
    Average lead time: 1 day

    From £84.36

    Average lead time: 1 day
  13. SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.
    In Stock
    Special Price £4.93 was £5.86 You save: £1.12 (16%)
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  14. Carbon Rods
    Carbon rods for vacuum coating.
    Average lead time: 1 day

    From £14.30

    Average lead time: 1 day
  15. Numbered Stubs
    Sequentially numbered stubs (1 - 10) for easy identification of samples.
    Average lead time: 1 day

    From £12.52

    Average lead time: 1 day
  16. SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
    SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
    In Stock
    £5.78
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  17. SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327
    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.
    In Stock
    Special Price £6.12 was £19.62 You save: £16.20 (69%)
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  18. Top Hat Screening Apertures
    Top hat screening apertures, 3mm diameter.
    Average lead time: 1 day

    From £141.99

    Average lead time: 1 day
  19. Finder Grids for SEM Specimens AGG2985
    Designed for use with large specimens, this grid can be used to isolate areas of interest. Nickel
    In Stock
    Special Price £33.55 was £38.53 You save: £5.98 (13%)
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  20. Finder grids for SEM specimens
    10mm diameter grids with markings on the grid bars to help define areas in which analyses are carried out.
    Average lead time: 1 day

    From £66.82

    Average lead time: 1 day
  21. Apertures, 3.04 x 0.25mm, Molybdenum
    3.04mm dia, 0.25mm thick. Molybdenum. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £50.16

    Average lead time: 1 day
  22. Apertures, 2.0 x 0.6mm, Platinum/Iridium
    2mm dia, 0.6mm thick. Platinum/Iridium. High-quality disc apertures for use in electron microscopes, Focus Ion Beam, microprobe and X-ray systems.
    Average lead time: 1 day

    From £36.39

    Average lead time: 1 day
  23. Evaporation Metals
    High purity wires and materials for use in evaporation and shadow casting.
    Average lead time: 1 day

    From £24.90

    Average lead time: 1 day
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You've viewed 23 of 23 products

LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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