Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.In Stock£94.84In Stock
SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.Call for leadtime£221.14Call for leadtime- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.In StockSpecial Price £6.12 was £19.62 You save: £16.20 (69%)In Stock
SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs.Average lead time: 1 dayFrom £77.04
Average lead time: 1 day
SEM Specimen Stubs, Deben CoolstageDeben Coolstage SEM Specimen StubsCall for leadtimeFrom £243.96
Call for leadtime- SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.In StockSpecial Price £34.97 was £64.44 You save: £35.36 (46%)In Stock
