Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
PELCO Q SEM Pin StubsPELCO Scanning Electron Microscopy Pin Stubs. A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.Call for leadtimeFrom £5.97
Call for leadtime
SEM Stub Holder BlockUseful SEM holder block to firmly hold SEM stubs while preparing specimens for examination under SEM.Average lead time: 1 dayFrom £52.80
Average lead time: 1 day
Silicon MountsSuper smooth, polished silicon mounts are ideal for applications where the machined surface of aluminium or carbon stubs can cause interference.Average lead time: 1 dayFrom £54.15
Average lead time: 1 day
SEM Stub GrippersThese scissor-shaped grippers are useful for handling SEM specimen stubs.Call for leadtimeFrom £7.54Call for leadtime
Ink Pen for SEM AGG3344Fine point writing pen which leaves a mark that can be read in the electron beam of the SEM.In Stock£3.85In Stock- Numbered StubsSequentially numbered stubs (1 - 10) for easy identification of samples.Average lead time: 1 day
From £12.52
Average lead time: 1 day 
Specimen Pin-Mount Adapter, 15x10xM4 AG15363-1Pin mount adaptor, 15 x 10mm H with M4 thread on one side.Call for leadtime£37.26Call for leadtime
