Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Call for leadtime£12.34Call for leadtime
SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £39.37
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £26.96
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtimeFrom £29.94
Call for leadtime
SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtimeFrom £21.23
Call for leadtime
SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £35.00
Average lead time: 1 day
SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs.Average lead time: 1 dayFrom £77.04
Average lead time: 1 day
SEM Specimen Stubs, Deben CoolstageDeben Coolstage SEM Specimen StubsCall for leadtimeFrom £243.96
Call for leadtime- SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.In StockSpecial Price £34.97 was £64.44 You save: £35.36 (46%)In Stock
PELCO Q SEM Pin StubsPELCO Scanning Electron Microscopy Pin Stubs. A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.Call for leadtimeFrom £5.97
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SEM Stub Holder BlockUseful SEM holder block to firmly hold SEM stubs while preparing specimens for examination under SEM.Average lead time: 1 dayFrom £52.80
Average lead time: 1 day
