Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.Average lead time: 1 day
From £63.92
Average lead time: 1 day - SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 1 day
From £32.80
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, 5mm high AGG3376SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.In Stock£68.22In Stock
- SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.Call for leadtime£67.71Call for leadtime
- SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.Call for leadtime
From £31.47
Call for leadtime - SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£11.36In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.In Stock£13.66In Stock
- SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313BSEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.Call for leadtime£6.96Call for leadtime
- SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313DSEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.In Stock£9.23In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313ASEM Specimen Stubs for HITACHI instruments. 15mm diameter.Call for leadtime£6.96Call for leadtime
- SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.Call for leadtime£221.14Call for leadtime
- SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.Call for leadtime£99.01Call for leadtime
- SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.In Stock£54.46In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.In Stock£61.76In Stock
- SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.Call for leadtime£8.72Call for leadtime
- SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£9.31In Stock
- SEM Specimen Stubs, 50mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.Call for leadtime
From £140.87
Call for leadtime - SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.Call for leadtime
From £98.16
Call for leadtime - SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.In Stock£6.11In Stock
- SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£4.81In Stock
- SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 day
From £1.15
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.In StockSpecial Price £6.12 was £19.62 You save: £16.20 (69%)In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.In StockSpecial Price £4.93 was £5.86 You save: £1.12 (16%)In Stock
- SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Call for leadtime£10.89Call for leadtime


























