Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.Call for leadtimeFrom £98.16
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SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.In Stock£6.11In Stock
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£4.81In Stock
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 dayFrom £1.15
Average lead time: 1 day- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.In StockSpecial Price £6.12 was £19.62 You save: £16.20 (69%)In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.In StockSpecial Price £4.93 was £5.86 You save: £1.12 (16%)In Stock
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Call for leadtime£10.89Call for leadtime
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Call for leadtime£12.34Call for leadtime- Carbon DiscsA range of 3mm thick carbon discs for mounting specimens.Average lead time: 1 day
From £22.03
Average lead time: 1 day 
Vitreous Carbon PlanchettesHigh purity, 2mm or 3mm thick planchettes with smooth polished surfaces, impermeable to gases and liquids. Suitable for analytical work and X-ray investigations. Also available unpolished.Average lead time: 1 dayFrom £38.66
Average lead time: 1 day
Carbon disc on 12.5mm stub. Box of 10 AGG3420
A 3mm thick carbon disc mounted on a conventional 12.5mm stub that provides an economical solution for microanalysis or low emission surface imaging applications requiring light element stubs.Call for leadtime£56.77Call for leadtime
SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £39.37
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £26.96
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtimeFrom £29.94
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SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtimeFrom £21.23
Call for leadtime- Pin type adaptor for Cambridge analytical stub AGG3657Adaptor allowing 32mm Cambridge stubs with re-entrant bases to be used in a stage designed for pin type stubs.Call for leadtimeSpecial Price £67.13 was £128.48 You save: £73.62 (48%)Call for leadtime
SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £35.00
Average lead time: 1 day
Hitachi holder for six pin stubs AGG3592M4 threaded holder to accommodate six pin stubs.In Stock£74.68In Stock
Gripping Stub AGG3392A small gripping stub enabling specimens to be mounted edge-on for SEM examination.In Stock£56.16In Stock
Stub AdaptorsThese adaptors allow JEOL, ISI/ABT/Topcon and Hitachi system users to accommodate the standard pin type stub format of the European and USA manufacturers.Average lead time: 1 dayFrom £10.77
Average lead time: 1 day
SEM preparation standThis 78mm diameter x 12mm high aluminium stand is useful for holding stubs while mounting specimens, or to hold specimens during carbon/metal coating.Average lead time: 1 dayFrom £80.33
Average lead time: 1 day
Pin Stub Extender 12.5mm with 3.2mm pin AG1531812.5mm (1/2") high, pin stub extender allows pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage.In Stock£55.63In Stock
Multi Holder for 6 Pin Stubs, M4 AG15411Multi holder accommodates up to six standard 12.7mm pin stubs.Call for leadtime£105.45Call for leadtime
Multi Holder for 12 Pin Stubs, M4 AG15417Multi holder accommodates up to 12 standard 12.7mm pin stubs.Call for leadtime£140.61Call for leadtime
