Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£9.20In Stock
- SEM Specimen Stubs, 12.7mm dia, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtime
From £26.72
Call for leadtime - SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£10.40In Stock
- Pin Stub - 100mm dia x 9.5mm Pin Height AGG319Aluminium pin stub available for AMRAY, Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan & TESCAN.In Stock£109.38In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Call for leadtime£49.22Call for leadtime
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Call for leadtime£31.24Call for leadtime
- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£5.78In Stock
- SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.Average lead time: 1 day
From £63.92
Average lead time: 1 day - SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 1 day
From £32.80
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, 5mm high AGG3376SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.In Stock£68.22In Stock
- SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.Call for leadtime£67.71Call for leadtime
- SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.Call for leadtime
From £31.47
Call for leadtime - SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£11.36In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.In Stock£13.66In Stock
- SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313BSEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.Call for leadtime£6.96Call for leadtime
- SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313DSEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.In Stock£9.23In Stock
- SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313ASEM Specimen Stubs for HITACHI instruments. 15mm diameter.Call for leadtime£6.96Call for leadtime
- SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.Call for leadtime£221.14Call for leadtime
- SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.Call for leadtime£99.01Call for leadtime
- SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.In Stock£54.46In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.In Stock£61.76In Stock
- SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.Call for leadtime£8.72Call for leadtime
- SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£9.31In Stock
- SEM Specimen Stubs, 50mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.Call for leadtime
From £140.87
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