Certified particle size standards for SEM

These particle size standards are certified for mean diameter and are traceable to National Institute of Standards and Technology (NIST) standards.

They are available as uniform spheres in a range of discrete sizes from 20nm to 2000μm. The spherical diameters are calibrated with linear dimensions transferred from NIST standard reference materials.

The products can be used for the calibration of electron microscopes, AFMs, light scattering instruments and other particle measuring equipment. Size standards are available in polystyrene, silica or glass.

Glass Size Standards
Glass microspheres can be used in any application that requires a NIST traceable size standard with a narrow size distribution, and where sample conditions may not be suitable for polystyrene spheres.
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POA
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Silicon Test Specimen
A silicon test specimen made of single crystal silicon of overall dimensions 5 x 5mm and is 0.5mm thick.
Average lead time: 1 day
From £56.20
Average lead time: 1 day
Certified Silicon Test Specimens
Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.
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From £325.82
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