SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

45˚ SEM Mount 12.7mm Aluminum, grooved edge AG16101
45˚ SEM Mount Ø12.7mm for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, AMRAY, Leica, CamScan, ETEC) SEM's.
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£38.73
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Thin Specimen Split Mount Holder, M4 AG15335-4
Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").
In Stock
£33.75
In Stock

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SEM pin mounts with engraved & numbered divisions
SEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.
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From £6.76
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