Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 dayFrom £9.32
Average lead time: 1 day
SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Call for leadtimeFrom £23.73
Call for leadtime
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£24.21In Stock
FEI Microtome 8mm SEM StubA small diameter stub designed for FEI instruments but can also be used with other microscopes.Average lead time: 1 dayFrom £11.86
Average lead time: 1 day- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 day
From £69.08
Average lead time: 1 day 
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399FSEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.In Stock£64.86In Stock
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.Average lead time: 1 dayFrom £25.40
Average lead time: 1 day
SEM pin stubs, high purity Aluminium, pack of 100 AGG301PHigh purity 12.5mm dia aluminium SEM pin stubs.In Stock£44.61In Stock
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£4.81In Stock
