SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
In Stock
£10.56
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SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306A
SEM Specimen Stubs for JEOL instruments. 10mm diameter.
In Stock
£12.67
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SEM Specimen Stubs, 10mm dia, 10mm high
SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
Average lead time: 1 day
From £12.07
Average lead time: 1 day
SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
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£49.22
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SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
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£31.24
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SALE
SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
In Stock
£5.78
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SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
SEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.
Average lead time: 1 day
From £63.92
Average lead time: 1 day
SEM Specimen Stubs, 15mm dia, 5mm high
SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
Average lead time: 1 day
From £32.80
Average lead time: 1 day
SEM Specimen Stubs, 32mm dia, 5mm high AGG3376
SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.
In Stock
£68.22
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SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20
SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.
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£67.71
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SEM Specimen Stubs, 32mm dia, 20mm high
SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.
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From £31.47
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SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385
SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.
In Stock
£11.36
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SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384
SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.
In Stock
£13.66
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SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172
SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.
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£8.72
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SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171
SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.
In Stock
£9.31
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SEM Specimen Stubs, 50mm dia, 5mm high
SEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.
Call for leadtime
From £140.87
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SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stub
SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.
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From £98.16
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SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbon
SEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.
Average lead time: 1 day
From £1.15
Average lead time: 1 day
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424
SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.
Call for leadtime
£10.89
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