Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 dayFrom £9.32
Average lead time: 1 day
SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Call for leadtimeFrom £23.73
Call for leadtime
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£24.21In Stock
Slotted specimen stub AGG301D12.5mm aluminium pin stub with a slot and two grub screws, allowing specimens to be clamped for examination. Sold as singles.In Stock£6.53In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£12.99In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£15.82In Stock
SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.Call for leadtime£134.78Call for leadtime
SEM pin stubs, high purity Aluminium, pack of 100 AGG301PHigh purity 12.5mm dia aluminium SEM pin stubs.In Stock£44.61In Stock
SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£11.36In Stock
SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.In Stock£13.66In Stock
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£4.81In Stock- Carbon DiscsA range of 3mm thick carbon discs for mounting specimens.Average lead time: 1 day
From £22.03
Average lead time: 1 day 
Carbon disc on 12.5mm stub. Box of 10 AGG3420
A 3mm thick carbon disc mounted on a conventional 12.5mm stub that provides an economical solution for microanalysis or low emission surface imaging applications requiring light element stubs.Call for leadtime£56.77Call for leadtime
Stub AdaptorsThese adaptors allow JEOL, ISI/ABT/Topcon and Hitachi system users to accommodate the standard pin type stub format of the European and USA manufacturers.Average lead time: 1 dayFrom £10.77
Average lead time: 1 day
Pin Stub Extender 12.5mm with 3.2mm pin AG1531812.5mm (1/2") high, pin stub extender allows pin stubs and pin stub sample holders closer to the pole piece without moving the SEM sample stage.In Stock£55.63In Stock- Numbered StubsSequentially numbered stubs (1 - 10) for easy identification of samples.Average lead time: 1 day
From £12.52
Average lead time: 1 day
