Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.Call for leadtime£221.14Call for leadtime
SEM cylinder mounts with engraved & numbered divisions for...SEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples.Call for leadtimeFrom £9.51
Call for leadtime
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 dayFrom £14.45
Average lead time: 1 day