SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306A
SEM Specimen Stubs for JEOL instruments. 10mm diameter.
In Stock
£12.67
In Stock

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SEM Specimen Stubs, 10mm dia, 10mm high
SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
Average lead time: 1 day
From £12.07
Average lead time: 1 day
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbon
SEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.
Average lead time: 1 day
From £1.15
Average lead time: 1 day