Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313BSEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.Call for leadtime£6.96Call for leadtime
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313DSEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.In Stock£9.23In Stock
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313ASEM Specimen Stubs for HITACHI instruments. 15mm diameter.Call for leadtime£6.96Call for leadtime
SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.In Stock£61.76In Stock- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.In StockSpecial Price £4.93 was £5.86 You save: £1.12 (16%)In Stock
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 dayFrom £14.45
Average lead time: 1 day
