SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 32mm dia, 10mm high AGG318
SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
In Stock
£86.66
In Stock

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SEM Specimen Stubs, 32mm dia, 5mm high AGG3376
SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.
In Stock
£68.22
In Stock

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SEM Specimen Stubs, 32mm dia, 20mm high
SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.
Call for leadtime
From £31.47
Call for leadtime
SEM Cylinder Specimen Mounts
Large Specimen and Metallurgical Mounts for JEOL microscopes.
Average lead time: 1 day
From £2.67
Average lead time: 1 day
Hitachi SEM Cylinder Specimen Mounts
Cylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.
Average lead time: 1 day
From £14.45
Average lead time: 1 day