Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 day
From £69.08
Average lead time: 1 day 
SEM Specimen Stubs, 32mm dia, 10mm high AGG318SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.In Stock£86.66In Stock
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.In Stock£94.84In Stock
SEM Specimen Stubs, 32mm dia, 5mm high AGG3376SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.In Stock£68.22In Stock
SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium.Call for leadtimeFrom £31.47
Call for leadtime
SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.Call for leadtime£99.01Call for leadtime- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.In StockSpecial Price £6.12 was £19.62 You save: £16.20 (69%)In Stock
SEM Stub Holder BlockUseful SEM holder block to firmly hold SEM stubs while preparing specimens for examination under SEM.Average lead time: 1 dayFrom £52.80
Average lead time: 1 day
