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Probes - General Imaging (SCOUT Range)
SCOUT 150 RAl - AC Silicon AFM probes with Al

SCOUT 150 RAl - AC Silicon AFM probes with Al

Scout 150 RAl - AC mode silicon AFM probes with Al reflective backside coating. Pack of 10.

All prices exclude VAT.

Description Tech Data

Product Description

The SCOUT 150 RAI is a general purpose probe for imaging in AC modes (non-contact/soft tapping), exhibiting exemplary dimensional tolerances and tip sharpness, characteristic of all NuNano AFM probes. The SCOUT 150 has an aluminium reflective backside coating.

40nm platinum coating with a 5nm titanium adhesion layer on both sides of the probe and a tip radius of less than 30nm.

Applications:

Non-contact and soft tapping modes in air.

Technical Data

Cantilever Specifications
Parameter	Nominal	Range
Spring constant (N/m)	18	10 - 26
Resonant frequency (kHz)	150	130 - 170
Shape	Rectangular
Length (μm)	225	223 - 227
Width (μm)	30	29 - 21
Thickness (μm)	5.5	5.0 - 6.0
Material	Silicon (n-type, antimony)
Resistivity (Ωcm)	0.02	0.015 - 0.025
NB. Nominal values for spring constants and resonant frequencies are calculated using well known formulae and based on expected probe dimensions. The ranges are calculated using measured dimensional variations.

Tip Specifications
Parameter	Nominal	Range
Radius (nm)	5	< 10
Height (μm)	6	5 - 8
Set back (μm)	7.5	6.5 - 8.5
Shape	Conical
Cone angle (°)	25	15 - 40
Material	Silicon (n-type, antimony)
Resistivity (Ωcm)	0.02	0.015 - 0.025

Chip Specifications
Length (mm)	3.4
Width (mm)	1.6
Thickness (mm)	0.3
Cantilever anchor	Yes
Alignment grooves	No

Coatings
Frontside / Tip	None
Backside / Reflective	40nm Al

Delivery & Returns

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