Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.
SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.
For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.
- Calibration Specimens on Ultra Thin SubstratesA range of gold on silicon and tin on silicon specimens specifically developed for use in conjunction with line width calibration wafers or other test systems where the height of a conventional specimen is a problem.Average lead time: 1 day
From £84.36
Average lead time: 1 day 
Pelco Nanogold resolution test standards for SEM and FESEMUnique gold nanoparticles on silicon provide resolution standards with known and uniform particle size, ideally suited for high resolution tests for SEM, FESEM and FIB/SEM systems.Call for leadtimeFrom £155.59
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Certified Silicon Test SpecimensIndividual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.Call for leadtimeFrom £325.82
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Reference specimens for backscattered electron detection systemsAn electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.Average lead time: 1 dayFrom £283.82
Average lead time: 1 day
Duplex reference specimen AGS1953An alternative and very sensitive test is by means of an alloy with two major copper/zinc phases separated by an atomic number difference of 0.1.Call for leadtime£320.46Call for leadtime
Pelco Gold SpecimenThis specimen consists of gold platelets with a wide size range and sharp, clearly defined edges, making it useful for determining and correcting astigmatism, and verifying instrument resolution.Call for leadtimeFrom £60.00
Call for leadtime- Critical dimension (CD) calibration test specimens - 10-5-2-1-0.5um...This CD calibration test specimen comprises five line patterns, each one clearly identified by its pitch.Call for leadtime
From £52.20
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Critical dimension (CD) calibration test specimens - 500-200-100 nm...This advanced CD calibration test specimen is suitable for calibrating smaller structures.Call for leadtimeFrom £725.22
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SEM 144nm Reference StandardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Call for leadtimePOA
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SEM 144nm Reference Standard, CertifiedThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Call for leadtimePOA
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SEM 300nm Reference StandardThese 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them easy to use for AFM, STM, Auger, FIB and SEM.Call for leadtimePOA
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292nm Reference Standard292nm pitch reference standard for very high resolution calibration of AFM, SEM, Auger and FIB.Call for leadtimeCall for leadtime
2-D holographic array standards2-D holographic array standards for simultaneous calibration of X and Y axes.Call for leadtimePOA
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Gold on Carbon AGS168 - Resolution Test SpecimenResolution test specimen with a particle size range from approximately 5 - 150nm.Average lead time: 1 dayFrom £65.29
Average lead time: 1 day
