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Certified Silicon Test Specimens

Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1%.
All prices exclude VAT.
Name & Code
Grouped product items
Code & DescriptionAvailabilityPriceQty
AGS1930-CT
Certified Planotec Silicon Test Specimen Unmounted
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£325.82
£325.82
AGS1932-CT
Certified Planotec Silicon Test Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin
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£331.68
£331.68
AGS1932A-CT
Certified Planotec Silicon Test Specimen on JEOL Stub 10 mm dia., 10 mm height
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£343.64
£343.64
AGS1932B-CT
Certified Planotec Silicon Test Specimen on ISI Stub 15 mm dia., 10 mm height
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£343.64
£343.64
AGS1932C-CT
Certified Planotec Silicon Test Specimen on Hitachi Stub 15 mm dia., 10 mm height
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£343.64
£343.64
AGS1932D-CT
Certified Planotec Silicon Test Specimen on Customer Specified Stub*
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POA
POA
AGS1932E-CT
Certified Planotec silicon test specimen on 12.5mm JEOL stub
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£343.64
£343.64
AGS1934-CT
Certified Planotec Silicon Test Specimen for Incident Light Microscopy, mounted on black slide
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£352.10
£352.10
Product Description

Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1% and are supplied with a laboratory certificate as documented proof. The equipment is checked against a reference specimen calibrated by the NPL by laser beam interferometry.

Also see our recalibration service.

The silicon specimen can be supplied on any stub.

* When requesting a quote for AGS1932D-CT, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.

Technical DataDelivery & Returns
More Calibration Standards
LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.