- TEM grid holder on SEM pin stubA pin-type aluminium stub allowing four TEM grids to be securely held for SEM work.Average lead time: 1 day
From £61.35
Average lead time: 1 day - SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon.In StockSpecial Price £4.93 was £5.86 You save: £1.12 (16%)In Stock
- SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium.Call for leadtimeSpecial Price £49.46 was £51.82 You save: £2.83 (5%)Call for leadtime
- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In StockSpecial Price £5.82 was £6.23 You save: £0.49 (7%)In Stock
- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£5.78In Stock
- SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 1 day
From £2.67
Average lead time: 1 day - SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 day
From £69.08
Average lead time: 1 day - SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.In StockSpecial Price £34.97 was £64.44 You save: £35.36 (46%)In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. CarbonIn StockSpecial Price £2.83 was £28.55 You save: £30.86 (90%)In Stock
- SEM Specimen Stubs, 12.7mm dia, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtime
From £26.72
Call for leadtime - SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 day
From £9.32
Average lead time: 1 day - SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtime
From £21.23
Call for leadtime - SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Call for leadtime
From £29.94
Call for leadtime - SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Call for leadtime
From £23.73
Call for leadtime - SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£24.21In Stock
- SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 day
From £26.96
Average lead time: 1 day - SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 day
From £39.37
Average lead time: 1 day - SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 day
From £35.00
Average lead time: 1 day - SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£3.11In Stock
- SEM Specimen Stubs, 10mm dia, 10mm high, carbon AGG323SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high. Carbon.In StockSpecial Price £1.15 was £1.64 You save: £0.59 (30%)In Stock
- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon.In StockSpecial Price £6.12 was £19.62 You save: £16.20 (69%)In Stock
- SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Call for leadtime£3.65Call for leadtime
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In Stock£3.89In Stock
- SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£3.89In Stock


























