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Instrumentation Tweezers & Tools SEM TEM LM AFM & SPM FIB General Consumables Cryo-EM Calibre Scientific Servicing Special Offers Featured Special Offers New Products

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SEM Specimen Stubs, 32mm dia, 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
Average lead time: 1 day
From £69.08
Average lead time: 1 day
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
Average lead time: 1 day
From £9.32
Average lead time: 1 day
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
In Stock
£24.21
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SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
In Stock
£3.11
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SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-6
12.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.
Call for leadtime
£3.65
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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
In Stock
£3.89
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SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
In Stock
£3.89
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SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£12.99
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SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
In Stock
£15.82
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SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
Call for leadtime
£134.78
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SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
Average lead time: 1 day
From £25.40
Average lead time: 1 day
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£9.20
In Stock

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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£10.40
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SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.
In Stock
£6.11
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SEM Specimen Stubs, 12.5mm dia, carbon AGG321
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
In Stock
£4.81
In Stock

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