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  1. SALE SEM Specimen Stubs
    SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
    SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
    In Stock
    £5.78
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  2. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
    In Stock
    £3.11
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  4. SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-6
    12.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.
    Call for leadtime
    £3.65
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  6. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
    In Stock
    £3.89
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  8. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
    In Stock
    £3.89
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  9. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £12.99
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  12. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £15.82
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  13. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
    Call for leadtime
    £134.78
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  15. SEM Specimen Stubs
    SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
    SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
    In Stock
    £10.56
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  17. SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5 mm pin
    SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £9.20
    In Stock
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  19. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £10.40
    In Stock
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  20. SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
    Call for leadtime
    £49.22
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  23. SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
    SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
    Call for leadtime
    £31.24
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  24. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.
    Call for leadtime
    £8.72
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  26. SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer
    SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.
    In Stock
    £9.31
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  28. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.
    In Stock
    £6.11
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  30. Carbon stubs
    SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424
    SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.
    Call for leadtime
    £10.89
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  31. Carbon stubs
    SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425
    SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.
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    £12.34
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LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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