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Instrumentation Tweezers & Tools SEM TEM LM AFM & SPM FIB General Consumables Cryo-EM Calibre Scientific Servicing Special Offers Featured Special Offers New Products

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SEM Specimen Stubs, 32mm dia, 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
Average lead time: 1 day
From £69.08
Average lead time: 1 day
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
Average lead time: 1 day
From £9.32
Average lead time: 1 day
SEM Specimen Stubs - Short Pin
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
Call for leadtime
From £23.73
Call for leadtime
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
In Stock
£24.21
In Stock

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FEI Microtome 8mm SEM Stub
A small diameter stub designed for FEI instruments but can also be used with other microscopes.
Average lead time: 1 day
From £11.86
Average lead time: 1 day
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399F
SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.
In Stock
£64.86
In Stock

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SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
Average lead time: 1 day
From £25.40
Average lead time: 1 day
SEM pin stubs, high purity Aluminium, pack of 100 AGG301P
High purity 12.5mm dia aluminium SEM pin stubs.
In Stock
£44.61
In Stock

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SEM Specimen Stubs, 12.5mm dia, carbon AGG321
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
In Stock
£4.81
In Stock

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