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  1. SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
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    £49.22
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  2. SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
    SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
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    £31.24
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  3. SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425
    SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.
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    £12.34
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LEAD TIMES: Average Lead Times are shown individually in working days for any products not currently in stock. Whilst we regularly update this, actual Lead Times can vary due to supply chain fluctuations.
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